X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed. XPS requires high vacuum (P ~ 10−8 millibar) or ultra-high vacuum (UHV; P < 10−9 millibar) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar.

Model : JPS - 9200
Brand : Jeol                     

General sample requirements/prerequisites and rules:

1. Preliminary discussions regarding samples and techniques must first be done with the head of Centre.
2. A guarantee letter must be given, addressed to the Head of Centre.
3. The sample must be pure. The phases must have been identified and proof of this must be given.
4. The sample must be stable (not reactive, toxic or corrosive)
5. The sample must be very dry in order to be placed in high vacuum.
6. All payments must be made before results can be taken.