Other advantages of FESEM include:

• The ability to examine smaller-area contamination spots at electron accelerating voltages compatible with energy dispersive spectroscopy (EDS).
• Reduced penetration of low-kinetic-energy electrons probes closer to the immediate material surface.
• High-quality, low-voltage images with negligible electrical charging of samples (accelerating voltages ranging from 0.5 to 30 kilovolts).
• Essentially no need for placing conducting coatings on insulating materials.
• For ultra-high-magnification imaging, we use in-lens FESEM.

Model : JSM - 7600F
Brand : Jeol
Person In Charge:  Hasdiyana Hashim

General sample requirements/prerequisites and rules:

1. Preliminary discussions regarding samples and techniques must first be done with the head of Centre.
2. A guarantee letter must be given, addressed to the Head of Centre.
3. The sample must be pure. The phases must have been identified and proof of this must be given.
4. The sample must be stable (not reactive, toxic or corrosive)
5. The sample must be very dry in order to be placed in high vacuum.
6. All payments must be made before results can be taken.

High-resolution transmission electron microscopy (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows for direct imaging of the atomic structure of the sample. HRTEM is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp2-bonded carbon (e.g. graphene, C nanotubes). While HRTEM is often also used to refer to high resolution scanning TEM (STEM, mostly in high angle annular dark field mode), this article describes mainly the imaging of an object by recording the 2D spatial wave amplitude distribution in the image plane, in analogy to a "classic" light microscope. For disambiguation, the technique is also often referred to as phase contrast TEM. At present, the highest point resolution realised in phase contrast TEM is around 0.5 ångströms (0.050 nm). At these small scales, individual atoms of a crystal and its defects can be resolved. For 3-dimensional crystals, it may be necessary to combine several views, taken from different angles, into a 3D map. This technique is called electron crystallography.

Model : JEM- 2100F
Brand : Jeol
Person In Charge:  Norashikin Kamaruddin
                       
General sample requirements/prerequisites and rules:

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed. XPS requires high vacuum (P ~ 10−8 millibar) or ultra-high vacuum (UHV; P < 10−9 millibar) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar.

Model : JPS - 9200
Brand : Jeol
Person In Charge:  Mohamad Fikrey Bin Ramli                        

General sample requirements/prerequisites and rules:

1. Preliminary discussions regarding samples and techniques must first be done with the head of Centre.
2. A guarantee letter must be given, addressed to the Head of Centre.
3. The sample must be pure. The phases must have been identified and proof of this must be given.
4. The sample must be stable (not reactive, toxic or corrosive)
5. The sample must be very dry in order to be placed in high vacuum.
6. All payments must be made before results can be taken.