The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM). SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously.
| Specifications | ||
| Model | : | XE-100 |
| Brand | : | Park System |
| Optical Magnification | : | 780X (optional 160X, 390X, or 1500X) |
| Field of View | : | 480 µm × 360 µm |
| Imaging Modes | : | Contact and Non-contact |
| Applications | : | Materials science, Life science, Nanotechnology |
| Scanning Range | : | Scan range of XY-scanner: 5 µm, 50 µm, or 100 µm |
| Scanning Speed | : | N/A |
| Z Range | : | 12 µm or 25 µm |
| Sample Size | : | Up to 100 × 100 mm, 20 mm thick, Up to 500 g |
| Scanning Resolution | : | Maximum data size: 4096 × 4096 pixels |
| Person In Charge | ||
| Nurul Wahida bt Aziz | ||
| Application Form |
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Photoluminescence (PL) spectroscopy is a non-contact, non-destructive method of probing the electronic structure of materials. It is caused by a two step photon absorption-emission process involving the electronic states of the material. The emission of light through this process is photoluminescence. By combining Raman analysis with PL detection, it is possible to characterise both the vibrational and electronic properties of materials on a single bench top platform
Combined Raman-PL systems allow confocal mapping capabilities with sub-micron spatial resolution. A wide range of excitation wavelengths is possible, from the UV to NIR, allowing control of the penetration depth into the material, and thus, control of the volume sampled. Systems can be configured with different detectors such as CCD and InGaAs, which provide high sensitivity detection from the UV out to 1.5 µm and beyond. Temperature stages can be used in combination with the Raman-PL systems allowing analysis of samples at temperatures down to 4.2K.
Model:HR-800
Brand: Jobin Yvon
Person In Charge: Nurul Wahida bt Aziz




