Person in Charge
Ts. Salifairus Mohammad Jafar
Tel : +603-5544 4415
Email : salifairus@uitm.edu.my
Centre :
Centre of Functional Material & Nanotechnology (FMN)
The atomic force microscope (AFM) is one kind of scanning probe microscopes (SPM). SPMs are designed to measure local properties, such as height, friction, magnetism, with a probe. To acquire an image, the SPM raster-scans the probe over a small area of the sample, measuring the local property simultaneously.
| Specifications : |
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| Model | : | XE-100 |
| Brand | : | Park System |
| Optical Magnification | : | 780X (optional 160X, 390X, or 1500X) |
| Field of View | : | 480 µm × 360 µm |
| Imaging Modes | : | Contact and Non-contact |
| Applications | : | Materials science, Life science, Nanotechnology |
| Scanning Range | : | Scan range of XY-scanner: 5 µm, 50 µm, or 100 µm |
| Scanning Speed | : | N/A |
| Z Range | : | 12 µm or 25 µm |
| Sample Size | : | Up to 100 × 100 mm, 20 mm thick, Up to 500 g |
| Scanning Resolution | : | Maximum data size: 4096 × 4096 pixels |